xxviii Acknowledgments (Academia Sinica, Taipei, Taiwan), Dr. Ming-Yang Wang (SpringSoft, Fremont, CA), Ho-Chun Wu (Cadence Design Systems, Hsinchu, Taiwan), Dr. Jin Yang (Intel, Hillsboro, OR), and all chapter/section contributors for cross-reviewing the manuscript. Special thanks also go to Wan-Ping Lee and Guang-Wan Liao of National Taiwan University and many colleagues at SynTest Technologies, Inc., including Dr. Ravi Apte, Boryau Sheu, Dr. Zhigang Jiang, Jianping Yan, Jianghao Guo, Fangfang Li, Lizhen Yu, Ginger Qian, Jiayong Song, Sammer Liu, and Teresa Chang who helped draw symbolic layouts, review the manuscript, solve exercises, develop lecture slides, and draw figures and tables. Finally, we would like to acknowledge the generosity of SynTest Technologies (Sunnyvale, CA) for allowing Elsevier to put an exclusive version of the com- pany's most recent VLSI Testing and DFT software on the Elsevier companion Web site for readers to use in conjunction with the book to become acquainted with DFT practices.