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CHAPTER 3 Design for testability - Pg. 97

CHAPTER Design for testability Laung-Terng (L.-T.) Wang SynTest Technologies, Inc., Sunnyvale, California 3 ABOUT THIS CHAPTER Design for testability (DFT) has become an essential part for designing very- large-scale integration (VLSI) circuits. The most popular DFT techniques in use today for testing the digital portion of the VLSI circuits include scan and scan-based logic built-in self-test (BIST). Both techniques have proved to be quite effective in producing testable VLSI designs. In addition, test com-