778 CHAPTER 18 Industrial control system operation routines 20. In a PCI-based embedded system, is the PCI BIOS the same thing as the CPU BIOS, or are they different? 21. In an industrial control system, the PCI initialization code can be broken into three logical parts: PCI device driver, PCI BIOS, and PCI firmware. Figures 18.10, 18.11, 18.12, and 18.13 describe a process in which a PCI bus system of four bridges is being initialized with the Linux approach. Please write what each of these three logic parts does in each of these four figures. 22. If possible, please investigate the working principles of other types of system bus, such as SCSI and USB, with regard to device installation and configuration in a bus-based embedded system. 23. Which approach, top-down or bottom-up, is mostly used in system diagnosis and in process diagnosis? 24. Please list the roles of fault databases, including fault table and dictionary, in the combinational fault diagnosis method. 25. Can you design a fault database of different format from those given in Figure 18.15 and 18.16 to reduce the large computational effort involved in building a fault dictionary and achieve the maximal fault resolution? 26. Figure 18.17 is a diagnostic tree used for locating faults by edge-pin testing. Please find both the starting and final fault-nodes to write the scenario of all sequential steps between the starting and final fault-nodes in this figure. 27. In Figure 18.19, a diagnostic tree can be created for the given test pattern to control the process of probing. This diagnosis tree consists of internal-nodes (circles) to mark the internal lines to be probed, and of terminal-nodes (rectangles) to show the possible result of diagnosis. The results of probing are indicated as passed (P) or failed (F). The most time-consuming part of guided-probe testing is moving the probe. To speed-up the fault location process, we need to reduce the number of probed lines. A lot of methods to minimize the number of probes are available. Please investigate as many methods minimizing the number of probes as possible. 28. Try to find a copier or printer such as one made by Hewlett-Packard, and let it be idle and observe for half an hour to see whether it is running and how to run calibrations. 29. Try to find a garage to investigate the methods and tools of calibrating a car speedometer; and set up an 8-term error model for it. 30. The generic calibration description consists of an error model and a number of equations and inequalities which describe the relationship between the model coefficients and a number of measurements. Unlike a conventional calibration, the method of solving the system of nonlinear equations and inequalities is not specified. Therefore, the generic calibration is rather more sophisticated than conventional calibration principles. If you have an interest, you can read some of the literature to obtain a deeper understanding of generic calibrations. 31. Solve the group of nonlinear equations given in Table 18.2 for the solutions of error models consisting of the error terms algebraically by identifying all the critical points and choosing the smallest value of the function at those critical points. 32. Please draw a diagram similar to Figure 18.22 for a typical temperature calibration test setup, based on this statement. "Most simply stated, temperature calibration consists of placing a thermometer under test into a known, stable temperature environment. A comparison is made between the actual temperature and the reading indicated by the thermometer under test and the difference is noted." 33. There are three classic calibrations for pressure equipment in industrial processes: pressure gauges, switches, and transmitters. What is the importance of checking the calibration of a pressure gauge while increasing and decreasing pressure is applied? What is the importance of checking the calibration of a pressure switch while increasing and decreasing pressure is applied? What is the importance of checking the calibration of a pressure transmitter while increasing and decreasing pressure is applied? Further Reading Angela Krstic, Wei-Cheng Lai, Li Chen, Sujit Dey. Self-Test for Programmable Core-Based Designs. IEEE Designs & Test of Computers. 2 (2002), 18­27. Dimitris Gizopoulos, Antonis Paschalis, Yervant Zorian. Embedded Processor-Based Self-Test. Kluwer Academic. 2004. Erik Larsson. Introduction to Advanced System-on-Chip test design and Optimization. Springer. 2005.