14.3 JMP Analysis of the Yield in a Chemical Reactor Example

Simple regression can be analyzed with either the specialized Fit Y by X platform or the more general Fit Model platform. Fit Y by X emphasizes graphical output and easily fits simple, curvilinear, and polynomial relationships. Fit Model requires more preparatory work. Both platforms use least squares to estimate all necessary model statistics.

14.3.1 Simple Regression Results with the Fit Y by X Platform

Always make sure that both Y and X are continuous variables in the JMP data table. Proceed as follows: